X-Ray Diffraction for Materials Research : From Fundamentals to Applications

This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how

• | : Myeongkyu Lee (Point Pleasant, New Jersey, USA)
• | Publisher: Apple Academic Press Inc.
• | Publication Date: Mar 31, 2021
• | Country of Publication: Canada
• | Number of Pages: 302 pages
• | Language: Unknown
• | Binding: Paperback / softback
• | ISBN-10: 1774635933
• | ISBN-13: 9781774635933