Functional Design Errors In Digital Circuits: Diagnosis Correction And Repair

Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. (2) an RTL error diagnosis method that identifies the root cause of errors directly;

• | By (Author): Kai-Hui Chang
• | Publisher: Springer-Verlag New York Inc.
• | Publication Date: Dec 10, 2008
• | Country of Publication: United States
• | Number of Pages: 200 pages
• | Language: Not Available
• | Binding: Hardback
• | ISBN-10: 1402093640
• | ISBN-13: 9781402093647