Quality Aspects in Spatial Data Mining
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Quality Aspects in Spatial Data Mining - 9780367386320

Taylor & Francis Ltd
SKU:
9780367386320
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UPC:
9780367386320
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Description



  • | Author: Alfred Stein, Wenzhong Shi, Wietske Bijker (Edited by)
  • | Publisher: Taylor & Francis Ltd
  • | Publication Date: Sep 19, 2019
  • | Country of Publication: United Kingdom
  • | Number of Pages: 374 pages
  • | Language: NA
  • | Binding: Paperback / softback
  • | ISBN-10: 0367386321
  • | ISBN-13: 9780367386320
Additional Information
By (Author):
Alfred Stein, Wenzhong Shi, Wietske Bijker (Edited by)
Publisher:
Taylor & Francis Ltd
Publication Date:
Sep 19, 2019
Country of Publication:
United Kingdom
Language:
NA
Number of pages:
374 pages
Binding:
Paperback / softback
ISBN-10:
0367386321
ISBN-13:
9780367386320
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