Thin Film Analysis by X-Ray Scattering

With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films.

• | Author: Mario Birkholz
• | Publisher: Wiley-VCH Verlag GmbH
• | Publication Date: Nov 15, 2005
• | Number of Pages:
• | Language:
• | Binding: Hardback
• | ISBN-13: 9783527310524
• | ISBN-10: 3527310525