Overview
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration.
- | By (Author): Jens Lienig
- | Publisher: Springer International Publishing AG
- | Publication Date: Mar 07, 2018
- | Country of Publication: Switzerland
- | Number of Pages: 159 pages
- | Language: Unknown
- | Binding: Hardback
- | ISBN-10: 3319735578
- | ISBN-13: 9783319735573