Overview
Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. (2) an RTL error diagnosis method that identifies the root cause of errors directly;
- | By (Author): Kai-Hui Chang
- | Publisher: Springer-Verlag New York Inc.
- | Publication Date: Dec 10, 2008
- | Country of Publication: United States
- | Number of Pages: 200 pages
- | Language: Not Available
- | Binding: Hardback
- | ISBN-10: 1402093640
- | ISBN-13: 9781402093647