Overview
Examines the state of technology maturity measurement, pointing out strengths and weaknesses of available measures, and proposing a complete technology maturity assessment as a potential solution. This book also includes a discussion of risk during technology development.
- | By (Author): William L. Nolte
- | Publisher: Information Age Publishing
- | Publication Date: Oct 17, 2008
- | Country of Publication: United States
- | Number of Pages: 216 pages
- | Language: Not Available
- | Binding: Paperback|Softback
- | ISBN-10: 1593119631
- | ISBN-13: 9781593119638
