Journey to Data Quality by Yang W. Lee (Author)
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Journey To Data Quality

MIT Press Ltd
SKU:
9780262513357
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UPC:
9780262513357
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Description
Journey To Data Quality


  • | By (Author): Yang W. Lee
  • | Publisher: MIT Press Ltd
  • | Publication Date: Aug 21, 2009
  • | Country of Publication: United States
  • | Number of Pages: 240 pages
  • | Language: Not Available
  • | Binding: Paperback|Softback
  • | ISBN-10: 0262513358
  • | ISBN-13: 9780262513357
Additional Information
By (Author):
Yang W. Lee
Publisher:
MIT Press Ltd
Publication Date:
Aug 21, 2009
Country of Publication:
United States
Number of pages:
240 pages
Binding:
Paperback|Softback
ISBN-10:
0262513358
ISBN-13:
9780262513357